Rietveld Quantitative Analysis Needed

I have a set of raw X-ray diffraction scans from a bulk sample of NiTi shape memory alloy and I need a full Rietveld refinement carried out for quantitative phase analysis. No previous refinements exist—what you receive from me will be the untouched raw data files together with basic acquisition details (instrument, scan range, step size).

The goal is clear: extract accurate weight percentages of every crystalline phase present and supply the refined structural parameters that support those figures. Please use a professional-grade suite such as GSAS-II, FullProf, or TOPAS; I’m happy with whichever you are most proficient in as long as the output is transparent and reproducible.

Deliverables
• Refined project file(s) compatible with the software you use
• Table of phase fractions with estimated errors
• Refined lattice parameters, R-factors, and goodness-of-fit statistics
• A brief report (PDF or Word) summarising method, assumptions, and conclusions
• High-resolution plots: experimental vs calculated pattern and difference curve

Acceptance criteria: weighted-profile R-factor and goodness-of-fit values must meet commonly accepted standards for quantitative work, and the sum of all phase fractions should converge to ~100 %.

Once I send the data, I’d like to have the initial refinement within a week, with one iteration for minor adjustments if needed.